显微镜解决方案 BX53-P

Specifications

A New Standard for Polarized Light Observation The BX53-P polarizing microscope provides superb performance in polarized light applications using a combination of UIS2 infinity-corrected optics and a distinctive optical design. An extended line of compatible compensators make the BX53-P microscope versatile enough to handle observation and measuring applications in virtually any field.

A New Standard for Polarized Light Observation

The BX53-P polarizing microscope provides superb performance in polarized light applications using a combination of UIS2 infinity-corrected optics and a distinctive optical design. An extended line of compatible compensators make the BX53-P microscope versatile enough to handle observation and measuring applications in virtually any field.

UIS2 Optics Provide Outstanding Expandability Maximizing the advantages of infinity correction, the UIS2 optical system helps prevent the deterioration of optical microscope performance and eliminates magnification factors, even when polarizing elements, like analyzers, tint plates, or compensators, are introduced into the light path. The BX53-P microscope also accepts intermediate attachments available for BX3 series microscopes, as well as cameras and imaging systems.

UIS2 Optics Provide Outstanding Expandability

Maximizing the advantages of infinity correction, the UIS2 optical system helps prevent the deterioration of optical microscope performance and eliminates magnification factors, even when polarizing elements, like analyzers, tint plates, or compensators, are introduced into the light path. The BX53-P microscope also accepts intermediate attachments available for BX3 series microscopes, as well as cameras and imaging systems.

Zonal structure of Plagioclase in quartz diorite. *Scales Indicate actual size of samples

Optical texture of MBBA *Scales Indicate actual size of samples

Bertrand Lens for Conoscopic and Orthoscopic Observations

With a conoscopic observation attachment, switching between orthoscopic and conoscopic observation is simple. It is focusable for viewing of clear back focal plane interference patterns. The Bertrand lens is focusable for clear viewing back focal plane interference patterns. The field stop makes it possible to consistently obtain sharp conoscopic images.

An Extensive Range of Compensators and Wave Plates Six different compensators are available for measurements of birefringence in rock and mineral thin sections. Measurement retardation level ranges from 0 to 20λ. For easier measurement and high image contrast, Berek and Senarmont compensators can be used, which change the retardation level in the entire field of view.

An Extensive Range of Compensators and Wave Plates

Six different compensators are available for measurements of birefringence in rock and mineral thin sections. Measurement retardation level ranges from 0 to 20λ. For easier measurement and high image contrast, Berek and Senarmont compensators can be used, which change the retardation level in the entire field of view.

MEASURING RANGE OF COMPENSATORS Compensator Measurement Range Applications Thick Berek (U-CTB) 0–11000 nm (20λ) Measurement of high retardation level (R*>3λ), (crystals, macromolecules,fi ber, etc.) Berek (U-CBE) 0–1640 nm (3λ) Measurement of retardation level (crystals,macromolecules, living organisms, etc.) Senarmont Compensator (U-CSE) 0–546 nm (1λ) Measurement of retardation level (crystals, living organisms, etc.); enhancement of image contrast (living organisms,etc.) Brace-Koehler Compensator1/10λ (U-CBR1) 0–55 nm (1/10λ) Measurement of low retardation level (living organisms, etc.) Brace-Koehler Compensator1/30λ (U-CBE2) 0–20 nm (1/30λ) Measurement of image contrast (living organisms,etc.) Quartz Wedge (U-CWE2) 500–2200 nm (4λ) Approximate measurement of retardation level (crystal, macromolecules, etc.) *R = retardation level For more accurate measurement, we recommend that compensators (except U-CWE2) be used together with the interference fi lter 45-IF546

Thick Berek (U-CTB)

0–11000 nm (20λ)

Measurement of high retardation level (R*>3λ), (crystals, macromolecules,fi ber, etc.)

0–1640 nm (3λ)

Measurement of retardation level (crystals,macromolecules, living organisms, etc.)

Senarmont Compensator (U-CSE)

Measurement of retardation level (crystals, living organisms, etc.); enhancement of image contrast (living organisms,etc.)

Brace-Koehler Compensator1/10λ (U-CBR1)

0–55 nm (1/10λ)