Raith IONMASTER - SIMS analysis for high‑resolution nm-scale elemental mapping
IONMASTER
Sub-25 nm SIMS imaging resolution。：Sub-2 ppm sensitivity and high dynamic range
广西科米瑞实验仪器设备有限公司生产销售 Raith IONMASTER，可提供产品参数、报价和售后服务咨询，价格面议。
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：Introduction
：Capabilities
：Sub-25 nm SIMS imaging resolution
：Sub-2 ppm sensitivity and high dynamic range
：Easy 3D sample reconstruction by means of multi-layer stacking using dynamic SIMS
：Single-digit-nm sample positioning on design or KLARF for automated region-of-interest (ROI) SIMS analysis
：Schematic working principle of the IONMASTER with MagSIMS, IonSelect and UltraPositioning.
：Unlock new capabilities with high‑precision SIMS analysis
：Highest spatial resolution and sensitivity in SIMS analysis
：Fastest time to result with full-spectrum acquisition
：Best measurement repeatability
：Best results through specific ion species
：Positioning
：Select
：Software
：A new era in nano-characterization and imaging
：Positioning and adjustment of the extraction system
：Data acquisition for different analysis modes
：Magnet control
：Focal plane detectors
：Technical data
：IONMASTER brochure (.pdf)
：Highest-resolution SIMS imaging and analysis
：RAITH offers integrated solutions that increase performance and create market opportunities. In any production environment.
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