METROLOGY SERIES: VDI/VDE 2630 CERTIFIED CT SCANNERS FOR DIMENSIONAL METROLOGY

METROLOGY SERIES: VDI/VDE 2630 CERTIFIED CT SCANNERS FOR DIMENSIONAL METROLOGY

Non destructive 3D measurement of internal & external features, VDI/VDE compliant

VDI/VDE 2630: THE REFERENCE METROLOGY CERTIFICATION

A CT scanner can produce stunning 3D images and reveal the internal structures of a part. But that alone doesn’t make it a metrology system. The difference? Certification according to the VDI/VDE 2630 standard.

THE METROLOGY SERIES AT RX SOLUTIONS

RX Solutions Metrology Series systems stand out with a dedicated approach to dimensional metrology by tomography. Beyond compliance with VDI/VDE 2630-1.3 and ASME B89.4.23, our CT scanners integrate exclusive hardware and software technologies specific to the Metrology Series, ensuring daily stability, traceability, and repeatability for your measurements.

Software tools dedicated to the Metrology Series

An optimized software workflow for metrology

Metrology software compatibility

Scans from the Metrology Series are natively compatible with:

Before delivery, each Metrology Series system undergoes double factory calibration: detector distortion correction and ultra-fine alignment. This calibration ensures VDI/VDE 2630-1.3 compliance from installation. A BEP (Best Equipment Performance) report documenting performance tests is provided with each system.

Our dedicated support program includes annual (or more frequent if needed) performance verification. If any drift is detected, on-site recalibration is performed by our teams to maintain VDI/VDE 2630-1.3 compliance throughout the system’s lifecycle.

Thanks to initial factory calibration, daily verification tools (ball-bar), and the annual maintenance program, your Metrology Series systems remain compliant with VDI/VDE 2630-1.3 and ASME B89.4.23 metrological standards over time.

OUR INDUSTRIAL METROLOGY CT

What is the Metrology Series from RX Solutions

Why choose CT for dimensional metrology

What is the difference between a standard CT system and a Metrology Series CT system

Which software is compatible with the Metrology Series

How is the Metrology Series calibrated and maintained to remain compliant

What is the VDI/VDE 2630 standard

VDI/VDE 2630-1.3 MPE SD: 5.5 µm + L/50

VDI/VDE 2630-1.3 MPE SD: 6 µm + L/50

What does VDI/VDE 2630-1.3 certification mean for my measurements

CT systems for certified dimensional accuracy

X-ray tomography has revolutionized research as well as industrial quality control by enabling comprehensive three-dimensional analyses—both internal and external—in a single scan, and most importantly, in a non-destructive manner (NDT).

How can we guarantee the traceability of dimensional measurements by CT

Developed by the Association of German Engineers (VDI) and the German Association for Electrical, Electronic & Information Technologies (VDE), this standard defines standardized methods to:

Test and qualify the metrological performance of a CT system