AMBER 2
Advanced FIB-SEM for Automated Sample Preparation, Nanoscale Characterization and Nanoprototyping
广西科米瑞实验仪器设备有限公司提供 TESCAN AMBER 2 产品资料、选型咨询、供货报价和售后服务支持,价格面议。
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Advanced FIB-SEM for Automated Sample Preparation, Nanoscale Characterization and Nanoprototyping
Tescan AMBER™ 2 is a fully automated Ga⁺ FIB-SEM designed for routine TEM sample preparation, nanoscale characterization, and prototyping across a wide range of materials.
Combining precision with ease of use, it delivers high-quality FIB imaging even at low accelerating voltages. The Field Free BrightBeam™ SEM column ensures nanoscale resolution and exceptional sample analysis versatility.
The highest detail and imaging contrast on any sample with field-free UHR-SEM column.
Ultimate resolution and optimized beam profile of Ga+ FIB ensures high-quality sample preparation and comprehensive prototyping application.
| Brand | TESCAN |
|---|---|
| Model / series | AMBER 2 |
| Instrument class | Plasma FIB-SEM |
| Primary workflow | Large-area and high-throughput FIB-SEM preparation and imaging |
| Product family | FIB-SEM Solutions |
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