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Tescan

AMBER 2

Advanced FIB-SEM for Automated Sample Preparation, Nanoscale Characterization and Nanoprototyping

品牌: TESCAN价格: 面议服务区域: 全国

广西科米瑞实验仪器设备有限公司提供 TESCAN AMBER 2 产品资料、选型咨询、供货报价和售后服务支持,价格面议。

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Tescan
说明规格FAQ

说明

Advanced FIB-SEM for Automated Sample Preparation, Nanoscale Characterization and Nanoprototyping

Tescan AMBER™ 2 is a fully automated Ga⁺ FIB-SEM designed for routine TEM sample preparation, nanoscale characterization, and prototyping across a wide range of materials.

Combining precision with ease of use, it delivers high-quality FIB imaging even at low accelerating voltages. The Field Free BrightBeam™ SEM column ensures nanoscale resolution and exceptional sample analysis versatility.

The highest detail and imaging contrast on any sample with field-free UHR-SEM column.

Ultimate resolution and optimized beam profile of Ga+ FIB ensures high-quality sample preparation and comprehensive prototyping application.

规格

BrandTESCAN
Model / seriesAMBER 2
Instrument classPlasma FIB-SEM
Primary workflowLarge-area and high-throughput FIB-SEM preparation and imaging
Product familyFIB-SEM Solutions

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