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Tescan

AMBER X 2

The Most Universal FIB-SEM: High-Throughput 3D Characterization and Ga+-Free high Quality Sample Preparation in the single Plasma FIB-SEM Platform

品牌: TESCAN价格: 面议服务区域: 全国

广西科米瑞实验仪器设备有限公司提供 TESCAN AMBER X 2 产品资料、选型咨询、供货报价和售后服务支持,价格面议。

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Tescan
说明规格FAQ

说明

The Most Universal FIB-SEM: High-Throughput 3D Characterization and Ga+-Free high Quality Sample Preparation in the single Plasma FIB-SEM Platform

Tescan AMBER X™ 2 is an advanced plasma FIB-SEM that combines the Mistral™ Plasma FIB column with the field-free BrightBeam™ UHR SEM to deliver high speed, precision, and versatility in sample preparation and characterization.

A unified platform for both precision TEM prep and large-volume 3D characterization

Ga+-free TEM lamella preparation with minimal amorphization damage

Fully automated (TEM AutoPrep Pro™) workflow for consistent and accessible sample preparation

规格

BrandTESCAN
Model / seriesAMBER X 2
Instrument classPlasma FIB-SEM
Primary workflowFIB-SEM tomography, analysis and sample preparation
Product familyFIB-SEM Solutions

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