AMBER X 2
The Most Universal FIB-SEM: High-Throughput 3D Characterization and Ga+-Free high Quality Sample Preparation in the single Plasma FIB-SEM Platform
广西科米瑞实验仪器设备有限公司提供 TESCAN AMBER X 2 产品资料、选型咨询、供货报价和售后服务支持,价格面议。
← 返回产品列表
The Most Universal FIB-SEM: High-Throughput 3D Characterization and Ga+-Free high Quality Sample Preparation in the single Plasma FIB-SEM Platform
Tescan AMBER X™ 2 is an advanced plasma FIB-SEM that combines the Mistral™ Plasma FIB column with the field-free BrightBeam™ UHR SEM to deliver high speed, precision, and versatility in sample preparation and characterization.
A unified platform for both precision TEM prep and large-volume 3D characterization
Ga+-free TEM lamella preparation with minimal amorphization damage
Fully automated (TEM AutoPrep Pro™) workflow for consistent and accessible sample preparation
| Brand | TESCAN |
|---|---|
| Model / series | AMBER X 2 |
| Instrument class | Plasma FIB-SEM |
| Primary workflow | FIB-SEM tomography, analysis and sample preparation |
| Product family | FIB-SEM Solutions |
请填写必填信息,我们将在工作日尽快回复。