Tescan MAGNA™
MAGNA
UHR SEM with TriLens™ immersion optics for the ultimate characterization of nanomaterials
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说明
UHR SEM with TriLens™ immersion optics for the ultimate characterization of nanomaterials
Tescan MAGNA™ is designed for high-performance surface characterization of nanomaterials. Its Triglav™ SEM column delivers ultra-high-resolution imaging, particularly at low beam energies, and the integrated In-Beam detection system enables energy-filtered and angle-resolved backscattered electron contrast.
The Tescan Essence™ interface offers a customizable, intuitive environment with dedicated modules for streamlined operation.
Ultra-high resolution and high-contrast imaging of next-gen materials
Unique TriBE™ and TriSE™ detection for advanced nano characterization
规格
| Brand | TESCAN |
|---|---|
| Model / series | MAGNA |
| Instrument class | Ultra-high resolution SEM |
| Primary workflow | Advanced materials and semiconductor imaging |
| Product family | SEM Solutions |
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