Tescan
MIRA XR
MIRA XR™ accelerates data acquisition and processing with fully integrated Dual Essence™ EDS, Wide Field Optics™, and In-Flight™ Automation. It reduces time to ultra-high-resolu...
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说明
Tescan MIRA XR™ accelerates data acquisition and processing with fully integrated Dual Essence™ EDS, Wide Field Optics™, and In-Flight™ Automation. It reduces time to ultra-high-resolution SEM data by at least 30% compared to conventional systems.
Ultra-high resolution capabilities by MIRA™ optimized BrightBeam™ technology
Accelerate time to data with In-Flight Beam Tracing™ and In-Flight Automatics for fast and repeatable imaging and analytical performance, even for the SEM novice users
Effortlessly navigate samples and identify regions of interest with Wide Field Optics™, enabling magnification from 1x
Achieve up to twice faster EDS data acquisition with reduced shading enabled by Dual Essence™ EDS
规格
| Brand | TESCAN |
|---|---|
| Model / series | MIRA XR |
| Instrument class | Ultra-high resolution SEM |
| Primary workflow | High-resolution SEM imaging |
| Product family | SEM Solutions |
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