Tescan TENSOR™
TENSOR
Novel Automated Platform for Analytical STEM and 4D-STEM Characterization
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说明
Novel Automated Platform for Analytical STEM and 4D-STEM Characterization
Tescan TENSOR™ delivers fast, multimodal characterization of nanoscale morphological, chemical, and structural properties. It uses STEM imaging, EDS analysis, and advanced 4D-STEM as well as 3D-ED and STEM/EDS tomography workflows. Fully integrated beam precession provides enhanced quality of diffraction data that results in higher accuracy and precision of strain analysis and phase-orientation mapping measurements. With Tescan TENSOR™ you can make confident decisions with data you can trust.
Characterize samples by multiple modalities using BF/DF STEM imaging, EDS analysis, 3D STEM/EDS tomography, and advanced 4D-STEM and/or 3D-ED workflows.
Increase yield and reproducibility with automatic microscope alignments that are done in the background with no user intervention.
Boost productivity with high-speed, high-sensitivity detectors that maintain fast acquisition across all modalities.
规格
| Brand | TESCAN |
|---|---|
| Model / series | TENSOR |
| Instrument class | 4D-STEM system |
| Primary workflow | Scanning transmission electron microscopy imaging and analysis |
| Product family | STEM Solutions |
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