NanoMOKE3
NanoMOKE3 Wafer Mapper 是为在整片晶圆范围内测量磁滞回线和磁畴图像而配置的超高灵敏度克尔效应磁强计。
广西科米瑞实验仪器设备有限公司提供 Durham Magneto Optics NanoMOKE3 产品资料、选型咨询、供货报价和售后服务支持,价格面议。
← 返回产品列表The NanoMOKE®3 Wafer Mapper is an ultrahigh sensitivity Kerr effect magnetometer specially configured for measuring magnetic hysteresis loops and domain images across the entire surface of large area samples. It is ideally suited for wafer-scale development and manufacture of MRAM, magnetic sensors and advanced materials.
Handles up to 330mm x 250mm wafers
Wafer stage travelling range of 204mm in X and 164mm in Y
Ultra-high sensitivity and stability
Very low noise
Highly focused laser spot
Video-rate microscope to allow precise positioning of laser spot on sample and domain imaging
3000 G applied field in x and y or z projected from beneath the wafer allowing free movement of wafer above electromagnet
Optional heating element to locally inject hot gas at the laser measurement point
Sensitive to Longitudinal, Transverse and Polar Kerr rotation and ellipticity
Obtains coercivity, remanence and exchange bias automatically from measured loops
Supplied with LX Pro, our easy to use and flexible control software
NanoMOKE3 wafer mapper
| 型号或系列 | NanoMOKE3 |
|---|---|
| Wafer handling | Handles up to 330mm x 250mm wafers |
| Wafer stage travel | Wafer stage travelling range of 204mm in X and 164mm in Y |
| Applied field | 3000 G applied field in x and y or z projected from beneath the wafer allowing free movement of wafer above electromagnet Optional heating element to locally inject hot gas at the laser measurement point Sensitive to Longitudinal, Transverse a |
| Control software | Supplied with LX Pro, our easy to use and flexible control software NanoMOKE3 wafer mapper |
| 规格书 | NanoMOKE3-wafer-mapping-specifications.pdf |
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