
OAI The OAI UV LED Light Source
This UV LED light source is designed and engineered by the proven lithography experts at OAI. The light source delivers a number of unique benefits, the most consequential of wh...
- 型号
- The OAI UV LED Light Source
细胞、分子、生物制药、培养与成像
显微镜、成像系统、光学平台与光学测量
消解、萃取、浓缩、纯化、研磨与进样
加热、恒温、干燥、制冷、水浴、烘箱与培养箱
真空系统、泵、阀、气体、流量与液体处理
材料表征、热分析、力学、粒度、表面和物性测试
天平、搅拌、摇床、清洗、灭菌、工作台和常规设备
半导体、电子测量、电源、电池、探针台与微纳加工
实验室工程、配套系统、家具、管路与辅助系统
按原厂分类保留的其他专用仪器
没有找到合适型号?
提交选型需求
This UV LED light source is designed and engineered by the proven lithography experts at OAI. The light source delivers a number of unique benefits, the most consequential of wh...

The OAI Model 2000 Exposure Systems may be configured as either an Edge-Bead Exposure System (2000SM) or a Flood Exposure System (2000AF); both configurations are based on OAI’s...

For Production Semiconductors, MEMS, Sensors, Advanced Packaging, IOT, Microfluidics

The Model 2012AF Flood Exposure System provides a cost-effective method for automated flood exposure.

The OAI Integrated I-V Test System is perfect for R&D as well as production, the OAI Integrated I-V Test System delivers extremely accurate solar cell performance measurement. O...

Automated Mask Aligner with integrated mask changer。The Model 6000A-MC is a precision system combining OAI's Model 6000, Automated Production Mask Aligner, with an integrated mask

OAI offers a complete line of high performance I-V Testers. I-V Testers and I-V Rider software may be ordered as a stand-alone system or integrated into any OAI Solar Simulator....

For Glass Panel Exposure。The Large Substrate Exposure System is designed for markets requiring exposure of large glass panels. Using OAI’s advanced beam optics, the system utilize

The OAI Single Long Pulse Solar Simulator and I -V Test System is designed specifically for High Efficiency Solar Cells. This test system overcomes the limitations of flash test...

Dependable and repeatable, the OAI Model 308 UV Light Meter is a precise, direct-reading instrument designed to measure UV light intensity. The Model 308 features detachable pro...

Built for high intensity applications, the OAI Model 308T UV Light Meter is a dependable, direct-reading instrument designed for measuring UV light intensity for UV curing. The ...

UV Light and Energy Meter for use with all wafer steppers Datasheet

The Hiresta UX is a high-performance meter for measuring the surface and volume resistivity of a wide variety of nonconductive materials. With an extended measurement range of 1...

The Loresta FX Resistivity Meter a handheld unit measures the low resistivity of samples with consistent accuracy. This resistivity meter measures resistivity using a wide varie...

The Loresta GX II Meter is an intelligent, multi-purpose low resistivity meter equipped with software that calculates resistivity correction factors. A variety of 4-pin probes a...

UV Ozone Treatment System Plus improves surface adhesion.。■ UV Ozone Treatment Systems available for R&D through production

Hiresta UX Reststivity Meter。The Hiresta UX is a high-performance meter for measuring the surface and volume resistivity of a wide variety of nonconductive materials.

OAI’s Flash Solar Power Meter is a versatile measurement tool used for measuring the irradiance (in Suns) from Flash Solar Simulators. Flash Solar Simulators are commonly used i...

The OAI Continuous Wave Solar Power Meter is an essential analytical tool for measuring the irradiance (in Suns) of Continuous Wave Solar Simulators. OAI’s Solar Power Meters fe...

Perfect for a wide variety of industries where the precise measurement of UV energy is essential, the Model 356 is designed for any application requiring repeatable, reliable UV...

UV Intensity & Energy Meter。Designed for use with ASML, Canon, Nikon and GCA & Rudolph Technology Wafer Steppers the Model 457 UV Light Intensity & Energy System accurately profil

AutoWafer 是用于研发和生产环境的无损超声晶圆扫描仪,可检测 MEMS、CMOS、memory、TSV 和 LED 等晶圆应用中的键合缺陷。

AutoWafer Pro 是用于生产环境中键合晶圆缺陷检测的超声设备,可对 200mm 和 300mm 键合晶圆进行快速高分辨率扫描。

Echo VS 在 ECHO 平台上加入 Image Enhancement Suite,用于提供图像质量和缺陷识别能力。
第 457 / 474 页