EDX3500 Benchtop EDXRF Elemental Analyzer
EDX3500 Benchtop EDXRF Elemental Analyzer
For the determination of total sulfur in petroleum and petroleum products that are single-phase. These materials can include diesel fuel, jet fuel, kerosene, other distillate oi...
广西科米瑞实验仪器设备有限公司生产销售 Koehler Instrument EDX3500 Benchtop EDXRF Elemental Analyzer,可提供产品参数、报价和售后服务咨询,价格面议。
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For the determination of total sulfur in petroleum and petroleum products that are single-phase. These materials can include diesel fuel, jet fuel, kerosene, other distillate oil, naphtha, residual oil, lubricating base oil, hydraulic oil, crude oil, unleaded gasoline, gasohol, and similar petroleum products. Also, for the determination of the total lead content of a gasoline. Conforms to the specifications of ASTM D4294, D5059, D6481, D7212, D7220, ISO 20847, ISO8754, IP 496, IP 336, JIS K 2541-1 Menu Based Software for control of spectrometer functions and data analysis Application templates Simple Flow Bar Wizard to create new methods Profile Fitting Software for qualitative and quantitative analysis Matching library for augmentation of fundamental parameters Automatic spectral overlap deconvolution Empirical Calibration with overlap and matrix compensation The K47925 EDXRF can analyze a large array of elements from 11Na to 92U in solids, liquids, alloys, powders and thin films. The Advanced model delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types. The Silicon Drift Detector provides superior data quality and the multiple automated tube filters enhance sensitivity. Also, polarized excitation is used for lower detection limits. Conforms to the specifications of: ASTM D4294, D5059, D6481, D7212, D7220, ISO 20847, ISO 8754, IP 496, IP 336, JIS K 2541-1. Excitation: 50 kV X-Ray Tube with Pd Anode 50W Maximum Power 4 Standard Polarization and Secondary Targets depending on application for optimum excitation Optional Fifth Target for optimal excitation of Na and Mg Detection: High Performance Silicon Drift Semiconductor Detector Peltier Electronic Cooling Optimum Balance of spectral resolution and high count rate Sample Chamber: Large 38cm dia. X 10cm deep sample chamber for bulk samples 15-Position Automatic Sample Changer (32mm Sample Cups) Analysis in Air, Helium Purge, or Vacuum Available User Interface (Computer): External PC Computer System including: Microsoft Windows Vista Operating System Keyboard and Mouse, Monitor, Printer Environmental Conditions: Ambient Temperatures 18 - 28°C (65 - 82°F) Relative Humidity < 75% Vibration undetectable by humans Free from corrosive gas, dust, and particles 50 kV X-Ray Tube with Pd Anode 50W Maximum Power 4 Standard Polarization and Secondary Targets depending on application for optimum excitation Optional Fifth Target for optimal excitation of Na and Mg
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