
Tescan
Deep Cross-Sectioning and Precision End-Pointing for Advanced Package Failure Analysis
- Brand
- TESCAN
- Model / series
- SOLARIS X 2
- Instrument class
- FIB-SEM
- Primary workflow
- Advanced FIB-SEM imaging, preparation and tomography
材料表征、热分析、力学、粒度、表面和物性测试设备
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Deep Cross-Sectioning and Precision End-Pointing for Advanced Package Failure Analysis

In-Situ Continuity for Dynamic-to-Detail discovery。is a dynamic micro-CT platform designed around one core concept: In-Situ Continuity.

High-Throughput, Multi-Scale Dynamic micro-CT for Imaging in Real-Time
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Versatile System for Optimized Performance at Ultra-High Vacuum
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WLAN无线数据记录仪。产品编码:0572 2031。
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