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分析检测仪器生命科学仪器显微成像与光学样品前处理温控加热与制冷真空泵阀与流体科米瑞仪器应用领域实验室仪器选型

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分析检测仪器387

色谱、质谱、光谱、电化学与理化分析仪器

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八通道电化学工作站
半导体晶圆检测系统
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显微成像与光学86

显微镜、成像系统、光学平台与光学测量设备

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倒置成像显微镜
倒置金相显微镜
倒置研究显微镜
多光子成像显微镜
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样品前处理36

消解、萃取、浓缩、纯化、研磨与进样设备

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冲击式采样器
吹扫捕集系列
吹扫捕集自动进样器
大型旋转蒸发仪
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温控加热与制冷56

加热、恒温、干燥、制冷、水浴、烘箱与培养箱

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低温泵
低温恒温槽系列
低温灭菌器
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真空泵阀与流体37

真空系统、泵、阀、气体、流量与液体处理设备

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96通道电动移液器
便携式蠕动泵
单级油封旋片泵
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材料物性与力学17

材料表征、热分析、力学、粒度、表面和物性测试设备

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在线粘度计
HI719-镁 Mg 硬度比色计-汉钠仪器(上海)有限公司
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安全称量站
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半微量天平
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电子电工与半导体16

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多通道电池测试系统
俄歇电子能谱仪(AES)
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其他专用仪器249

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11357匹配产品
全部分析检测仪器生命科学仪器显微成像与光学样品前处理温控加热与制冷真空泵阀与流体材料物性与力学环境安全与现场检测实验室通用设备电子电工与半导体
GIGAbatch 360/380P
Plasma Surface Treatment / Plasma Frontend / Gigabatch 360PPVA TePla型号 GIGAbatch 360/380P

GIGAbatch 360/380P

Plasma Surface Treatment。Plasma Frontend。GIGAbatch 360P/380P。The plasma systems GIGAbatch 360P and 380P are suitable for the most challenging requirements in...

Model / product family
GIGAbatch 360/380P
产品类别
Plasma Surface Treatment / Plasma Frontend / Gigabatch 360P
Frequency
2.45 GHz
功率
0-1,000 W
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PlaTeG.Nitride
Plasma Surface Treatment / Pulse Plasma NitridingPVA TePla型号 PlaTeG.Nitride

PlaTeG.Nitride

Plasma Surface Treatment。Pulse Plasma Nitriding。Mono-Plant: • Low cost entry • One chamber • Option for Shuttle and Tandem

Model / product family
PlaTeG.Nitride
产品类别
Plasma Surface Treatment / Pulse Plasma Nitriding
尺寸
200 / 280
Pulse current PP generator [A]
60 / 60
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Fluoride Ion Cleaning System
Purification / Fluoride Ion CleaningPVA TePla型号 Fluoride Ion Cleaning System

Fluoride Ion Cleaning System

Purification。Fluoride Ion Cleaning。Designed to handle the most demanding superalloy components, our system enables thorough, damage-free cleaning deep into c...

Model / product family
Fluoride Ion Cleaning System
产品类别
Purification / Fluoride Ion Cleaning
Station
Single or dual
Chamber dimension (mm)
850 or customized
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Carbon.Pure
Purification / Graphite PurificationPVA TePla型号 Carbon.Pure

Carbon.Pure

Purification。Graphite Purification。Key Features。With optimized temperature distribution and intelligent gas handling impurity levels of 15ppm and less are ob...

Model / product family
Carbon.Pure
产品类别
Purification / Graphite Purification
Charge weight max. [kg]
300
Usable dimensions max. (ØxH) [mm]
600 x 900
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Carbide.Sint
Sintering / High Pressure SinteringPVA TePla型号 Carbide.Sint

Carbide.Sint

High Pressure Sintering。Precise. Reliable. Productive.。Excellent temperature uniformity in both vacuum and pressure operation

Model / product family
Carbide.Sint
产品类别
Sintering / High Pressure Sintering
Temperature [°C]
1,600
Pressure [bar]
100
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Ceramic.Sint
Sintering / High Pressure SinteringPVA TePla型号 Ceramic.Sint

Ceramic.Sint

High Pressure Sintering。Productive. Reliable. Efficient.。Robust and reliable performance

Model / product family
Ceramic.Sint
产品类别
Sintering / High Pressure Sintering
Temperature [°C]
2,100
Pressure [bar]
60
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VEgauge
Thin Film InspectionPVA TePla型号 VEgauge

VEgauge

Thin Film Inspection。Built around your process。Fully customizable inline inspection system for macroscopic and microscopic surface inspection

Model / product family
VEgauge
产品类别
Thin Film Inspection
Measurement mode
Reflectance
Measurement time
Based on sample sizes and manufacturing process
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VEpioneer series
Thin Film InspectionPVA TePla型号 VEpioneer series

VEpioneer series

Thin Film Inspection。Full insight from your bench-top。Fully integrated, one-button bench-top Hyperspectral Vision system, ready to use out of the box

Model / product family
VEpioneer series
产品类别
Thin Film Inspection
Measurement mode
Reflectance
Measurement time
< 10 s (typical)
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VEreveal
Thin Film InspectionPVA TePla型号 VEreveal

VEreveal

Thin Film Inspection。One system replaces many。Inline inspection system built for semiconductor fab environments (ISO class 3)

Model / product family
VEreveal
产品类别
Thin Film Inspection
Measurement mode
Reflectance
Measurement time
< 10 s (typical)
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Multi-Axis XYZ
Volume Inspection / Ultrasonic Non Destructive TestingPVA TePla型号 Multi-Axis XYZ

Multi-Axis XYZ

Multi‑Axis Industrial NDT。Multi‑axis motion: X, Y, Z。5 different configurations available

Model / product family
Multi-Axis XYZ
产品类别
Volume Inspection / Ultrasonic Non Destructive Testing
电源电压
120/240 VAC, 1 phase, 20 Amps
Water
Type 2 de-ionized
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Vue series
Volume Inspection / Ultrasonic Non Destructive TestingPVA TePla型号 Vue series

Vue series

Through-Transmission (except Mini Vue)。B-Scan Cross Section Images。C-Scan Planar Images

Model / product family
Vue series
产品类别
Volume Inspection / Ultrasonic Non Destructive Testing
电源电压
120/240 VAC 5 Amps
Water
Type 2 de-ionized
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LuXpector THEA
Wafer Inspection / EllipsometryPVA TePla型号 LuXpector THEA

LuXpector THEA

Cost-Efficient Operation: Reduced total cost of ownership (TCO) through intelligent design, modular components, and low maintenance requirements.

Model / product family
LuXpector THEA
产品类别
Wafer Inspection / Ellipsometry
Footprint
2,500 x 1,520 mm (incl. FOUPs)
Electrical connection
230 V, 50-60 Hz, 2,5 kVA
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SIRD SiC 200
Wafer Inspection / Scanning Infrared DepolarizationPVA TePla型号 SIRD SiC 200

SIRD SiC 200

Scanning InfraRed Depolarization。Features at a glance。Stress Measurement Quantitative stress measurement on wafer level

Model / product family
SIRD SiC 200
产品类别
Wafer Inspection / Scanning Infrared Depolarization
Principle
Stress-induced optical birefringence
Stress Sensitivity
≥ 0.1 kPa in-plane shear stress
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SIRD
Wafer Inspection / Scanning Infrared DepolarizationPVA TePla型号 SIRD

SIRD

Wafer Inspection。Scanning InfraRed Depolarization。Functional Description。A robot transfers the wafer from the carrier to the measurement stage. The carrier c...

Model / product family
SIRD
产品类别
Wafer Inspection / Scanning Infrared Depolarization
Principle
Stress-induced optical birefringence
Stress sensitivity
≥ 0.1 kPa in-plane shear stress
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Wafer Surface Measurement System
Wafer Inspection / Vapor Phase DecompositionPVA TePla型号 Wafer Surface Measurement System

Wafer Surface Measurement System

Vapor Phase Decomposition。Features at a glance。All media, from process chemicals to ICP-MS calibration, are supplied fully automatically by the system.

Model / product family
Wafer Surface Measurement System
产品类别
Wafer Inspection / Vapor Phase Decomposition
Wafer sizes
4" - 12"
Surfaces
Hydrophobic/hydrophilic/bevel/upper bevel
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Wafer Surface Preparation System
Wafer Inspection / Vapor Phase DecompositionPVA TePla型号 Wafer Surface Preparation System

Wafer Surface Preparation System

Vapor Phase Decomposition。Features at a glance。Layout for maximum robustness against cross-contamination.

Model / product family
Wafer Surface Preparation System
产品类别
Wafer Inspection / Vapor Phase Decomposition
Wafer sizes
4" - 12"
Surfaces
Hydrophobic/hydrophilic/bevel/upper bevel
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QIAsprint Connect System: Automated magnetic bead extraction
显微成像与表征仪器QIAGEN型号 QIAsprint

QIAsprint Connect System: Automated magnetic bead extraction

Benchtop instrument for automated magnetic particle based nucleic acid purification from up to 2x96 samples in parallel using QIAsprint extraction chemistry;...

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TissueLyser III Bead Mill Homogenizer for Sample Prep
样品制备与纯化仪器QIAGEN型号 TissueLyser

TissueLyser III Bead Mill Homogenizer for Sample Prep

Bead mill, 100–120/220–240 V, 50/60 Hz; requires TissueLyser Adapters (available separately)

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EZ2 Connect Automated DNA/RNA Purification System
显微成像与表征仪器QIAGEN型号 EZ2

EZ2 Connect Automated DNA/RNA Purification System

Benchtop instrument for automated isolation of nucleic acids from up to 24 samples in parallel, using sealed prefilled cartridges; includes 1-year warranty o...

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QIAcube Connect
样品制备与纯化仪器QIAGEN型号 QIAcube

QIAcube Connect

Instrument: robotic workstation for automated purification of DNA, RNA or proteins using QIAGEN spin column kits; including 1-year warranty on parts and labor

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QIAsymphony SP/AS Instruments for DNA/RNA Extraction
色谱与质谱仪器QIAGEN型号 QIAsymphony

QIAsymphony SP/AS Instruments for DNA/RNA Extraction

QIAsymphony assay setup module: includes 1-year warranty on parts and labor

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TissueLyser LT: Bead Mill Tissue Homogenizer
样品制备与纯化仪器QIAGEN型号 TissueLyser

TissueLyser LT: Bead Mill Tissue Homogenizer

Compact bead mill, 100–240 V AC, 50–60 Hz; requires the TissueLyser LT Adapter, 12-Tube (available separately)

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TissueRuptor II
光谱与元素分析仪器QIAGEN型号 TissueRuptor

TissueRuptor II

(120 V, 60 Hz, US)。Rapid, effective disruption of a range of sample types。Disposable probes help to minimize cross-contamination

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QIAcube HT
显微成像与表征仪器QIAGEN型号 QIAcube

QIAcube HT

w/o laptop, System。Reliable DNA, RNA and miRNA extraction from virtually any sample type

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